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Testing Third-Party PCI Cards

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Chapter 3. Test Strategy


Functional Test Phase

In the Functional Test phase, the product undergoes the functional test suites as available for certain class-specific drivers. Currently, the following classes are defined:

  • SCSI

  • Graphics

  • Video/Audio

  • Network

  • Serial/ Parallel

  • Other

If it is not possible to test a device because the resources and test environment are not available, Sun will work with the IHV representative to define a suitable test suite and site. For example, testing an ESCON device requires connection to an IBM mainframe, which Sun does not have.

Refer to Perform Functional Testing for the test procedure. If the test fails at any point during testing, further testing will be discontinued. Once the problems are fixed, testing may restart from the beginning.